Trademark: 75259026
Status Date
Saturday, December 26, 2009
Registration Number
2248114
Registration Date
Tuesday, May 25, 1999
Filing Date
Tuesday, March 18, 1997
Published for Opposition
Tuesday, August 11, 1998
Cancellation Date
Saturday, December 26, 2009
9 ellipsometer based apparatus for transparent film thickness measurement for use in the semiconductor, disk drive, magnetic data storage, optical data storage, thin films and coatings industries
Oct 28, 2020
Automatic Update Of Assignment Of Ownership
Dec 26, 2009
Cancelled Sec. 8 (10-Yr)/Expired Section 9
Sep 9, 2004
Registered - Sec. 8 (6-Yr) Accepted & Sec. 15 Ack.
Jul 21, 2004
Registered - Sec. 8 (6-Yr) & Sec. 15 Filed
May 25, 1999
Registered-Principal Register
Mar 15, 1999
Allowed Principal Register - Sou Accepted
Mar 2, 1999
Assigned To Examiner
Feb 22, 1999
Statement Of Use Processing Complete
Feb 3, 1999
Use Amendment Filed
Nov 3, 1998
Noa Mailed - Sou Required From Applicant
Aug 11, 1998
Published For Opposition
Jul 13, 1998
Notice Of Publication
Jun 2, 1998
Approved For Pub - Principal Register
Sep 24, 1997
Non-Final Action Mailed
Sep 18, 1997
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24