Trademark: 75074075
Status Date
Thursday, February 12, 1998
Filing Date
Monday, March 18, 1996
Published for Opposition
Tuesday, November 19, 1996
Abandoned Date
Thursday, February 12, 1998
9 optically-based instrument and software for measuring the thickness of thin films on semiconductor wafers by means of reflectance of light at multiple wavelengths
Feb 12, 1998
Abandonment - No Use Statement Filed
Aug 14, 1997
Extension 1 Granted
Jul 24, 1997
Extension 1 Filed
Feb 11, 1997
Noa Mailed - Sou Required From Applicant
Nov 19, 1996
Published For Opposition
Oct 18, 1996
Notice Of Publication
Sep 16, 1996
Approved For Pub - Principal Register
Sep 13, 1996
Non-Final Action Mailed
Sep 9, 1996
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24