Trademark: 74290936
Status Date
Thursday, May 1, 2014
Registration Number
1836593
Registration Date
Tuesday, May 17, 1994
Filing Date
Monday, July 6, 1992
Published for Opposition
Tuesday, February 22, 1994
9 overlay measurement, critical dimension measurement, and registration measurement tools; and defect inspection models and tools for use in the semiconductor manufacturing industry
May 17, 2023
Courtesy Reminder - Sec. 8 (10-Yr)/Sec. 9 E-Mailed
May 1, 2014
Notice Of Acceptance Of Sec. 8 & 9 - E-Mailed
May 1, 2014
Registered And Renewed (Second Renewal - 10 Yrs)
May 1, 2014
Registered - Sec. 8 (10-Yr) Accepted/Sec. 9 Granted
Apr 21, 2014
Registered - Combined Section 8 (10-Yr) & Sec. 9 Filed
Apr 21, 2014
Teas Section 8 & 9 Received
Apr 21, 2014
Teas Change Of Correspondence Received
Apr 18, 2014
Attorney/Dom.Rep.Revoked And/Or Appointed
Apr 18, 2014
Teas Revoke/App/Change Addr Of Atty/Dom Rep Received
Aug 2, 2007
Case File In Ticrs
Mar 18, 2004
Registered And Renewed (First Renewal - 10 Yrs)
Mar 18, 2004
Registered - Sec. 8 (10-Yr) Accepted/Sec. 9 Granted
Jan 26, 2004
Registered - Combined Section 8 (10-Yr) & Sec. 9 Filed
May 12, 2000
Registered - Sec. 8 (6-Yr) Accepted & Sec. 15 Ack.
Feb 4, 2000
Registered - Sec. 8 (6-Yr) & Sec. 15 Filed
May 17, 1994
Registered-Principal Register
Feb 22, 1994
Published For Opposition
Jan 21, 1994
Notice Of Publication
Dec 20, 1993
Approved For Pub - Principal Register
Nov 1, 1993
Correspondence Received In Law Office
Jun 8, 1993
Final Refusal Mailed
Apr 22, 1993
Correspondence Received In Law Office
Oct 26, 1992
Non-Final Action Mailed
Sep 22, 1992
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24
