Trademark: 74139937
Status Date
Saturday, September 28, 2002
Registration Number
1669266
Registration Date
Tuesday, December 24, 1991
Filing Date
Tuesday, February 19, 1991
Published for Opposition
Tuesday, October 1, 1991
Cancellation Date
Saturday, September 28, 2002
9 computer program for use with an optical measurement device for measuring grain structure thickness and reflectivity data of metal layers on a semiconductor sample
Sep 28, 2002
Cancelled Sec. 8 (10-Yr)/Expired Section 9
Feb 20, 1997
Registered - Sec. 8 (6-Yr) Accepted & Sec. 15 Ack.
Jan 29, 1997
Registered - Sec. 8 (6-Yr) & Sec. 15 Filed
Dec 24, 1991
Registered-Principal Register
Oct 1, 1991
Published For Opposition
Aug 30, 1991
Notice Of Publication
Jul 16, 1991
Approved For Pub - Principal Register
May 23, 1991
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24