Trademark: 73817101
Status Date
Friday, January 15, 2016
Registration Number
1619547
Registration Date
Tuesday, October 30, 1990
Filing Date
Friday, August 4, 1989
Published for Opposition
Tuesday, August 7, 1990
Cancellation Date
Friday, January 15, 2016
9 COMPUTER BASED STATION FOR THE AUTOMATIC CHARACTERIZATION OF SEMICONDUCTOR WAFERS AS TO THICKNESS, GLOBAL AND SITE FLATNESS, BOW, WARP, CONDUCTIVITY TYPE, RESISTIVITY AND OTHER PARAMETERS
Jan 15, 2016
Cancelled Sec. 8 (10-Yr)/Expired Section 9
Aug 26, 2009
Automatic Update Of Assignment Of Ownership
Aug 19, 2009
Automatic Update Of Assignment Of Ownership
Dec 24, 2008
Case File In Ticrs
Mar 7, 2001
Registered And Renewed (First Renewal - 10 Yrs)
Mar 7, 2001
Registered - Sec. 8 (10-Yr) Accepted/Sec. 9 Granted
Oct 19, 2000
Registered - Combined Section 8 (10-Yr) & Sec. 9 Filed
Jun 13, 1996
Registered - Sec. 8 (6-Yr) Accepted & Sec. 15 Ack.
Nov 30, 1995
Registered - Sec. 8 (6-Yr) & Sec. 15 Filed
Oct 30, 1990
Registered-Principal Register
Aug 7, 1990
Published For Opposition
Jul 11, 1990
Notice Of Publication
Jul 10, 1990
Notice Of Publication
Jul 7, 1990
Notice Of Publication
May 16, 1990
Approved For Pub - Principal Register
Apr 27, 1990
Correspondence Received In Law Office
Nov 6, 1989
Non-Final Action Mailed
Sep 25, 1989
Assigned To Examiner
Trademark Alertz updated from USPTO on 2030-01-24
