Trademark: 98109935
Status Date
Tuesday, April 9, 2024
Filing Date
Monday, July 31, 2023
7 Semiconductor wafer inspection system used to inspect wafers for darkfield defects, including particles, scratches, and humps
Apr 9, 2024
Notification Of Non-Final Action E-Mailed
Apr 9, 2024
Non-Final Action E-Mailed
Apr 9, 2024
Non-Final Action Written
Apr 9, 2024
Notification Of Non-Final Action E-Mailed
Apr 9, 2024
Non-Final Action E-Mailed
Apr 9, 2024
Non-Final Action Written
Mar 25, 2024
Assigned To Examiner
Feb 7, 2024
Teas Change Of Correspondence Received
Feb 7, 2024
Attorney/Dom.Rep.Revoked And/Or Appointed
Feb 7, 2024
Teas Revoke/App/Change Addr Of Atty/Dom Rep Received
Feb 7, 2024
Applicant/Correspondence Changes (Non-Responsive) Entered
Feb 7, 2024
Teas Change Of Owner Address Received
Aug 29, 2023
New Application Office Supplied Data Entered
Aug 3, 2023
New Application Entered
Trademark Alertz updated from USPTO on 2030-01-24